Recently, the emerging and pervasive world of nano-technologies expanded the need for a high-resolution characterization tool outside the traditional high-tech domain. As a consequence, advanced high-resolution tools working at the nano-scale are now more widely used in R&D activities, offering the opportunity for a better understanding of the phenomena of sub-micron feature-size dependence. In the present paper we will give an overview of the synergistic use of two high-resolution techniques with the jewelry manufacturing technology perspective: Focused Ion Beam (coupled with electron beam) imaging, milling and deposition technique (briefly called FIB), and Nano-indentation Testing. After a basic description of both techniques (architecture, probe-sample interaction basics and operation modes), we will demonstrate the effectiveness of this approach for microstructural investigation on very small samples without any sample preparation or pre-processing; low-cost, fast and site-specific sample preparation for TEM analysis; mechanical hardening effect on microstructure and hardness profile at the micron scale; failure analysis; and understanding of plasticity and elasticity behavior.

Author: Dr. Edoardo Bemporad